[Press Release]Rigaku Wins Diana Nyyssonen Memorial Best Paper Awardwith Method for Inspecting and Measuring Defects in 3D Flash Memory -Non-destructive visualization of nanoscale structures realized using ultra-high-resolution X-ray microscope-

[Press Release]The Rigaku Group’s XwinSys Changes its Name to Rigaku Semiconductor Instruments -To strengthen its manufacturing of equipment for advanced semiconductor packaging-

[Press Release]Rigaku Announces XSPA-200 ER Detector for X-ray Diffraction System　Supports Convenient, Highly Sensitive Analysis in a Desktop instrument

[Press Release]Rigaku Develops Technology for 3D Visualization of the Atomic-scale Structure of Amorphous Carbon-Contributes to the development of high-performance materials for battery devices and the like –

[Press Release]Novel Electron Density Topography Technology to Reveal Biological Macromolecules’ Properties -A Solution to Accelerate Biopharmaceutical R&D –

[Press Release]Rigaku Analytical Devices Partners with Leading Supplier of Products and Services to the Pharmaceutical Industry

[Press Release]Rigaku Conducts Elemental Analysis of a Sample Obtained by NASA of the Asteroid Bennu

[Press Release]Rigaku Analyzes Samples Collected By NASA’s OSIRIS-Rex

[Press Release]Rigaku’s Analysis of the Asteroid Ryugu by WDXRF and Thermal Analysis will be Invaluable for Future Research Projects