Rigaku Accelerates Adoption of EDT -New technology visualizing biomolecular shape and motion advances life-science research-

New Method Enables Structural Determination of Diverse Phenolic Compounds from a Tiny Alpine Flower Sample

[Information] “To Improve Our World by Powering New Perspectives”:Rigaku’s 75th Anniversary and the Next Stage of Growth in X-ray Analytical Technology

[Press Release]Rigaku Launches NEX QC II Series Benchtop XRF Analyzers for Industrial QC at Pittcon 2026

[Information] Notice of Changes in Excecutive Officers – Rigaku Holdings Corporation –

[Press Release]Rigaku launches ONYX 3200, a Metrology Instrument for Semiconductor Manufacturing-Enables complete metal inspection for all processes from chip wiring to advanced packaging on a single platform-

[Information] Rigaku to Exhibit at SEMICON Japan 2025 -Showcasing the Latest X-ray Metrology and Analysis Technologies for Advanced Devices and Advanced Packaging-

[Press Release]Rigaku Launches XTRAIA MF-3400, a Measuring Instrument for Next-generation Semiconductors – High-precision wafer measurement meets surging demand from AI and data centers –

[Information]Rigaku’s X-ray Analytical Technology Wins Special Award in the Local Commendations for Invention for the Third Consecutive Year[Information]